Solid Performance in Any Environment
Utilizing industrial grade temperature SLC (Single Level Cell) NAND flash components and high speed DRAM cache for data buffering, ATP Velocity SII SSD offers an extended operating temperature range of -40°C to +80°C, provides outstanding performance and proven reliability for products operating outside the standard temperature range (0°C to +70°C).
ATP Velocity SII SSD is perfect for industrial applications such as transportation, industrial PC, healthcare, telecommunications, and other harsh environments where data integrity and consistent performance is mission critical.
ATP Velocity MII SSD is designed for enterprise storage systems with outstanding sequential read and write performance to relieve performance bottlenecks associated with traditional rotating media HDD storage. ATP Velocity MII SSD brings new life into existing enterprise storage infrastructures and increases server and workstation utilization.
Full Manufacturer Support and Product Consistency
Being a true manufacturer gives ATP the ability to support customers with a fixed BOM (Bill of Materials) policy, ensuring both consistent compatibility and performance. ATP also fully supports its customers with product customization and tuning to optimize performance in particular or specialized applications.
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Specifications |
Applications |
Velocity SII
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Extended Temperature: -40°C ~ +80°C
SLC NAND Flash
IOPS:
4KB Random Read: up to 20,000
4KB Random Write: up to 7,000
Sequential Read: up to 260MB/s
Sequential Write: up to 240MB/s
SATA |
Industrial PC/Embedded
Healthcare
Networking/Telecommunications
Transportation
Military/Aerospace
High Performance Computing |
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Specifications |
Applications |
Velocity MII
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Standard Temperature: 0°C ~ +70°C
MLC NAND Flash
IOPS:
4KB Random Read: up to 5,300
4KB Random Write: up to 4,300
Sequential Read: up to 220MB/s
Sequential Write: up to 170MB/s
SATA |
High Performance Computing
Enterprise Computing
Networking/Telecommunications |
• Pre-screened extended temperature SLC (Single-Level-Cell) NAND flash memory
• Enhanced endurance by dynamic and static wear-leveling
• Hardware ECC & EDC
• Supports S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology)
• Data integrity under power cycling
• In-house environment reliability testing, customized environmental testing available
• Application specific design, product performance tuning/customization
• In-house FAE team support, "our lab is your lab"
• System Level endurance/reliability testing
• Long term supported fixed/controlled BOM
• Optional SMART monitor software available |
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